Extended-depth of field random illumination microscopy, EDF-RIM, provides super-resolved projective imaging

Avatar
Poster
Voice is AI-generated
Connected to paperThis paper is a preprint and has not been certified by peer review

Extended-depth of field random illumination microscopy, EDF-RIM, provides super-resolved projective imaging

Authors

Mazzellat, l.; Mangeat, T.; Li, H.; Creff, J.; Rogez, B.; Martins, C.; Galland, F.; Allain, M.; Giroussens, G.; Idier, J.; Labouesse, S.; Sentenac, A.; LeGoff, L.

Abstract

The ultimate aim of fluorescence microscopy is to achieve high-resolution imaging of increasingly larger biological samples. Extended depth of field presents a potential solution to accelerate imaging of large samples when compression of information along the optical axis is not detrimental to the interpretation of images. We have implemented an Extended Depth of Field (EDF) approach in a Random Illumination Microscope (RIM). RIM uses multiple speckled illuminations and variance data processing to double the resolution. It is particularly adapted to the imaging of thick samples as it does not require the knowledge of illumination patterns. We demonstrate highly-resolved projective images of biological tissues and cells.

Follow Us on

0 comments

Add comment