Lorenzo Beretta, Nathaniel Harms, Caleb Koch

We prove tight upper and lower bounds of $\Theta\left(\tfrac{1}{\epsilon}\left( \sqrt{2^k \log\binom{n}{k} } + \log\binom{n}{k} \right)\right)$ on the number of samples required for distribution-free $k$-junta testing. This is the first tight bound for testing a natural class of Boolean functions in the distribution-free sample-based model. Our bounds also hold for the feature selection problem, showing that a junta tester must learn the set of relevant variables. For tolerant junta testing, we prove a sample lower bound of $\Omega(2^{(1-o(1)) k} + \log\binom{n}{k})$ showing that, unlike standard testing, there is no large gap between tolerant testing and learning.